Measure topography, roughness and layer thickness in the micro and sub-nanometer range within seconds.
Using different optical sensors, our systems quickly and reliably capture the surface. The robust sensor technology works reliably not only on transparent and metallic surfaces, but also on rough and polished surfaces.
- No sample preparation
- Fast data recording
- Height resolution down to the sub-nanometer range
- DIN and ISO compliant evaluations
- Robust and highly precise
- Non-contact and non-destructive
- Real 3D data
- Regardless of material properties such as color, gloss or hardness
Quick and easy measurement
The proven technology behind our confocal microscopes and interferometers delivers high-resolution 3D data of your workpiece surface within seconds. Due to the fact that you do not have to prepare the sample and that the devices are easy to operate, you save more valuable time. The measuring process and data evaluation can be automated to ensure smooth integration into your production environment.
Measure without contact
Optical measurement guarantees non-destructive testing of all surfaces – regardless of characteristics such as color, gloss or hardness. Even at high measuring speeds, the measuring microscopes and white-light Interferometers deliver high-quality measurement data for true-to-profile reproduction of the finest roughness structures or micro-geometries. Due to the non-contact measuring methods, the sensor technology is wear-free.
Evaluate in three dimensions
Whether confocal microscope or white light interferometer: The measurement results are available as true height coordinates (x, y, z). In addition to 2D and 3D roughness values, these can be used to determine, among other things, flatness, volume, layer thickness, shape or contour. The evaluation of profile and surface data complies with international standards – for example according to DIN EN ISO 25178.
Confocal microscopes and optical profilometers:
The MarSurf CM und MarSurf CP/CL series
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| MarSurf CM mobile – ready for use anywhere |
MarSurf CM explorer – The flexible all-rounder |
MarSurf CP/CL select – Optical 2D / 3D profilometry |
White light interferometer for extremely smooth surfaces:
MarSurf WI series
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| MarSurf WI 50 M – The manual starter solution |
MarSurf WI 50 – High precision for research & Quality Management |
MarSurf WI 100 – Automated professional device for extra large parts |
