Measure topography, roughness and layer thickness in the micro and nanometer range within seconds.

The optical 3D surface metrology of the MarSurf CM, CL and CP series uses the confocal principle to scan the surface. The robust sensor technology works reliably – on transparent, metallic, as well as rough and polished surfaces.

  • No sample preparation
  • Fast data recording
  • Height resolution down to the nanometer range
  • DIN and ISO compliant evaluations
  • Robust and highly precise
  • Non-contact and non-destructive
  • Real 3D data
  • Regardless of material properties such as color, gloss or hardness

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